Fruit growing
and viticulture of South Russia

Annotation

One of the main reasons for the decline of sowing qualities of seeds and planting material is the presence of various internal defects, such as a hidden injury or damage by pests. The seeds with hidden defects can�t be sorted by the sorting machines, and so they are a constant component of all production of seeds batches. These seeds can be detected by X-ray analysis. Microfocus X-ray can be used to control the quality of seeds and to study their internal structure. The purpose of this work is the development of microfocus X-ray technique to determine the quality of fruits and seeds. Voltage, anode current and exposure time are included in the definition of the required zoom factor modes of X-ray apparatus. Mode of microfocus X-ray for control of fruits and seeds different on structure and size was selected. It was confirmed that this technique can be used to inspect the fruit and seeds of various sizes and structure. The method approbation was carried out on a large number of fruits and seeds from the collection of the Botanic Garden of Great Peter (Saint-Petersburg). It has been confirmed that the use of microfocus X-ray technique allows you to quickly select the executed seeds, not affected by pests, and use them for future planting and getting of a greater number of shoots. It was confirmed, that method can be used for analysis of seeds inside of fruits. The prospects for this technique to identify the problems with the collected seeds had been shown.